Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

Precession Electron Diffraction in the Transmission Electron Microscope: electron crystallography and orientational mapping

Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEM instruments of voltages 100 to 300 kV to turn them into true electron diffractom...

Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera

On the alignment for precession electron diffraction.

Precession electron diffraction has seen a fast increase in its adoption as a technique for solving crystallographic structures as well as an alternative to conventional selected-area and converged-beam diffraction methods. One of the key issues of precession is the pivot point alignment, as a stationary apparent beam does not guarantee a fixed pivot point. A large precession tilt angle, along ...

Aberration-corrected precession electron diffraction

Precession electron diffraction (PED) is a promising technique for collecting high quality diffraction patterns for rapid nanoscale structural characterization [1]. It is able to reduce dynamical scattering effects, improving the interpretability of diffraction intensities over those obtained by conventional electron diffraction techniques. When used on a microscope that can produce a fine prob...

Accurate and precise lattice parameters by selected-area electron diffraction in the transmission electron microscope

Lattice parameters for gold nanocrystals, quartz, and vesuvianite have been determined by electron diffraction in routine transmission electron microscopy (TEM) work, with precision and accuracy near to 0.1%, after correction for elliptical distortion. The distortion, measured in three different microscopes, is constant for each microscope and may be easily eliminated. Variable camera constants...